Micro-Raman Spectroscopy Study of Vertical GaN Schottky Diode
نویسندگان
چکیده
In this work, the physical and electrical properties of vertical GaN Schottky diodes were investigated. Cathodo-luminescence (CL), micro-Raman spectroscopy, SIMS, current-voltage (I-V) measurements performed to better understand effects parameters, for example structural defects doping level inhomogeneity, on diode performances. Evidence dislocations in epilayer was spotted thanks CL measurements. Then, using 2D mappings E2h A1 (LO) Raman modes, other peculiar observed. The I-V revealed a significant increase leakage current with applied reverse bias up 200 V. combination characterization methods indicated that biased seems more correlated short range non-uniformities effective than strain fluctuation induced by dislocations.
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ژورنال
عنوان ژورنال: Crystals
سال: 2023
ISSN: ['2073-4352']
DOI: https://doi.org/10.3390/cryst13050713